The fidelity of the tag-antitag system: Characterization of the stringent temperature for robustness in the excess limit

International Journal of Knowledge-Based and Intelligent Engineering Systems

Volumn 9, Issue 4, 2005, Pages 285-292

  Rose, John A ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85013589951     PISSN: 13272314     EISSN: 18758827     Source Type: Journal    
DOI: 10.3233/KES-2005-9404     Document Type: Article

References (21)

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