Repair of memory arrays by cutting

Proceedings - International Workshop on Memory Technology, Design and Testing, MTDT 1998

Volumn 1998-August, Issue , 1998, Pages 124-130

  Park, N ^a   Lombardi, E ^b  

^a South Dakota School of Mines and Technology   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL OVERHEADS; MEMORY ARRAY; MEMORY CHIPS; REPAIR SOLUTION; YIELD ENHANCEMENT;

REPAIR;

EID: 85013254829     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.1998.705958     Document Type: Conference Paper

References (9)

1. Yamaguchi, H., Hongo, M., Miyauchi, T. and M. Mitani, "Laser Cutting of Aluminum Stripes for Debugging Integrated Circuits," IEEE Journal of Solid State Ccts, Vol. SC20, No. 6., pp. 1259-1264, 1985.
2. Kuo, S-Y and W.K. Fuchs, "Efficient Spare Allocation in Reconfigurable Arrays," Proc. ACM/IEEE DAC, pp. 385-390, 1986.
3. Dahbura, A.T. and R.W. Haddad, "Increasing the Throughput of the Testing and Repair of RAMs with Redundancy," AT&T Bell Labs, Internal Report, Murray Hill, 1986; also in Proc. IEEE ICCAD, Santa Clara, 1987.
4. Huang, K.W. and F. Lombardi, "Approaches for the Repair of VLSI/WSI RRAMs by Row/Column Deletion," Proc. IEEE FTCS18, pp. 342-347, 1988.
5. Gary, M.R. and D.S. Johnson, "Computers and Intractability," Freeman, San Francisco, 1979.
6. Hasan, N., Cong, J. and C.L. Liu, "A General Model for Fault Covering Problems in Reconfigurable Arrays," Proc. IEEE Workshop on Defect and Fault Tolerance in VLSI Systems, 1988.
7. Lombardi, F., Negrini, R., Sami, M.G. and R. Stefanelli, "Reconfiguration of VLSI Arrays: A Covering Approach," Proc. IEEE FTCS17, pp. 251-257, 1987.
8. Stapper, C. "Block Reallignment: a Powerful Method for Increasing the Yield ofMemory Chips that are Partially Good," Proc. IEEE Int. Workshop on Defects and Fault Tolerance, pp. 6.3.1-6.3.11, 1988.
9. Huang, W-K, Lombardi, F. and Y-N Shen, "Novel Approaches for the Repair of RAMs with Redundancy," IEEE Trans. of ICAS, Vol. CAD 9, No. 3, pp. 323-328, 1990.