Large Aperture Micro-Focus KB Mirrors for Spectroscopy Experiments at the Advanced Light Source

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 772-775

  Warwick, T ^a   Andresen, N ^a   Comins, J ^a   Franck, A ^a   Gilles, M ^a   Tonnessen, T ^b   Tyliszczak, T ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b InSync Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85012295336     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1757910     Document Type: Conference Paper

References (7)

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2. Underwood, J, Hussain, Z., McKinney, W. R. and Warwick, T. "1. 5 Meter VLS Emission Spectrometer", ALS Beamline Note, LSBL 622, 29 March, 2002.
3. Kirkpatrick, P. and Baez, A. V., "Formation of Optical Images by Xrays" J. Opt. Soc. Am. 38, 1948, pp. 776-774.
4. Howells, M. R., Cambie, D., Duarte, R. M., Irick, S., MacDowell, A., Padmore, H. A., Renner, T., Rah, S. and Sandler, R., "Theory and practice of elliptically bent x-ray mirrors", Opt. Eng. 39, 2000, pp. 2748-2762
5. Ferme, J. J., "An advanced KB mirror pair for microfocusing" Nucl. Instrum. Meth. A467-468, 2001, pp. 279-282.
6. Cocco, D., Marsi, M., Kiskinova, M., Prince, K. C., Schmidt, T., Heun, S., and Bauer, E., "A Microfocusing VLS grating based beamline for advanced microscopy" EUV, Xray and Neutron Optics and Sources", Proc. SPIE 3767, 1999, pp. 271-279
7. Locklin, S., Rah, S., Irick, S., Howells, M., "Progress in elliptical bender mirror adjustment using the Long Trace Profiler," ALS Beamline Note, LSBL 381, 26 May, 1997.