A diffractometer control system with automatic UB-matrix refinement

AIP Conference Proceedings

Volumn 705, Issue , 2004, Pages 1229-1232

  Furukawa, Yukito ^a   Matsumoto, Norimasa ^b  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85012261850     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1758022     Document Type: Conference Paper

References (5)

1. Ueki, T., Journal of the Crystallographic Society of Japan, 10, 222-231 (1968), in Japanese.
2. URL http://www.certif.com/.
3. Tanaka, R., et., al., ICALEPCS'95 Cicago, USA, 201 (1995).
4. Furukawa, Y., et., al., ICALEPCS'2001 San Jose, USA, 349 (2001).
5. URL http://www.spring8.or.jp/ENGLISH/facility/bl/SPring8BL/BL46XU/46xu.html.