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Volumn 27, Issue 23, 1991, Pages 2115-2116
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Experimental comparison of base recombination currents in abrupt and graded AlGaAs/GaAs heterojunction bipolar transistors
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Author keywords
Semiconductor devices and materials; Transistors
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Indexed keywords
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EID: 85011620903
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19911310 Document Type: Article |
Times cited : (25)
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References (8)
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