Joint Modeling of Mean and Dispersion

Technometrics

Volumn 40, Issue 2, 1998, Pages 168-171

  Nelder, John A ^a   Lee, Youngjo ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85011487584     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1998.10485225     Document Type: Article

References (16)

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