Addendum: A model for fatigue in ferroelectric perovskite thin films (Appl. Phys. Lett. (2000) 76(8) (1060–1062) (10.1063/1.125938))

Applied Physics Letters

Volumn 76, Issue 24, 2000, Pages 3655-

  Dawber, Matthew ^a   Scott, J F ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85010706874     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126739     Document Type: Erratum

References (2)

1. M. Dawber and J. F. Scott, Integr. Ferroelectr. (in press)
2. J. F. Scott, Ferroelectric Memories (Springer, Heidelberg, 2000), pp. 134–143.