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Volumn 124, Issue 7, 2004, Pages 977-983

Consideration on AC (Power-Frequency) Insulation Tests for High Voltage Power Equipment

Author keywords

fault distribution; high voltage; insulation test; power equipment; Weibull distribution

Indexed keywords


EID: 85010235406     PISSN: 03854213     EISSN: 13488147     Source Type: Journal    
DOI: 10.1541/ieejpes.124.977     Document Type: Article
Times cited : (6)

References (7)
  • 1
    • 85010231138 scopus 로고
    • JEC-0102-1994: Standard for Test Voltages, (in Japanese)
    • Standard of the Japanese Electrotechnical Committee: JEC-0102-1994: Standard for Test Voltages (1994) (in Japanese)
    • (1994)
  • 2
    • 85010231308 scopus 로고
    • A Consideration on Mathematical Models Applied for Long-term V-t (Voltage-lifetime) Characteristics
    • (-4), (in Japanese)
    • H. Hirose: “A Consideration on Mathematical Models Applied for Long-term V-t (Voltage-lifetime) Characteristics”, T. IEE Japan, Vol. 106-A, No. 4, pp. 185–192 (1985-4) (in Japanese)
    • (1985) T. IEE Japan , vol.106-A , Issue.4 , pp. 185-192
    • Hirose, H.1
  • 3
    • 85010235035 scopus 로고
    • V-t Characteristics and Probabilistic Distribution of Partial Discharge and Breakdown Voltages for Transformer Insulation
    • (-10), (in Japanese)
    • M. Ikeda, T. Inoue, and T. Yanari: “V-t Characteristics and Probabilistic Distribution of Partial Discharge and Breakdown Voltages for Transformer Insulation”, T. IEE Japan, Vol. 101-B, No. 10, pp. 571–578 (1981-10) (in Japanese)
    • (1981) T. IEE Japan , vol.101-B , Issue.10 , pp. 571-578
    • Ikeda, M.1    Inoue, T.2    Yanari, T.3
  • 4
    • 85010236000 scopus 로고
    • Breakdown Probability Distribution and V-t Characteristics of Transformer
    • (-11), (in Japanese)
    • M. Ikeda, S. Menju, and H. Murano: “Breakdown Probability Distribution and V-t Characteristics of Transformer”, T. IEE Japan, Vol. 95-B, No. 11, pp. 555–562 (1975-11) (in Japanese)
    • (1975) T. IEE Japan , vol.95-B , Issue.11 , pp. 555-562
    • Ikeda, M.1    Menju, S.2    Murano, H.3
  • 5
    • 0141932432 scopus 로고    scopus 로고
    • Theoretical Foundation for Residual Lifetime Estimation
    • H. Hirose: “Theoretical Foundation for Residual Lifetime Estimation”, IEEJ Trans. PE, Vol. 116-B, No. 2, pp. 168–173 (1996-2)
    • (1996) IEEJ Trans. PE , vol.116-B , Issue.2 , pp. 168-173
    • Hirose, H.1
  • 7
    • 0022892180 scopus 로고
    • Discharge Characteristics of Gaseous Dielectrics
    • T. Takuma: “Discharge Characteristics of Gaseous Dielectrics”, IEEE Trans. EI, Vol. EI-21, No. 6, pp. 855–867 (1986)
    • (1986) IEEE Trans. EI , vol.EI-21 , Issue.6 , pp. 855-867
    • Takuma, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.