Predicting grain yield using canopy hyperspectral reflectance in wheat breeding data

Plant Methods

Volumn 13, Issue 1, 2017, Pages

  Montesinos López, Osval A ^a,b   Montesinos López, Abelardo ^c   Crossa, José ^a   los Campos, Gustavo ^d   Alvarado, Gregorio ^a   Suchismita, Mondal ^a   Rutkoski, Jessica ^a,e   González Pérez, Lorena ^a   Burgueño, Juan ^a  

^a INTERNATIONAL MAIZE AND WHEAT IMPROVEMENT CENTER CIMMYT   (Mexico)

^b UNIVERSIDAD DE COLIMA   (Mexico)

^c CENTRO DE INVESTIGACIÓN EN MATEMÁTICAS   (Mexico)

^d MICHIGAN STATE UNIVERSITY   (United States)

^e INTERNATIONAL RICE RESEARCH INSTITUTE   (Philippines)

Author keywords

Bayes B; Fourier regression; Genome selection; Prediction accuracy; Spectral data; Spline regression; Vegetation indexes; Wheat

Indexed keywords

EID: 85010210779     PISSN: None     EISSN: 17464811     Source Type: Journal    
DOI: 10.1186/s13007-016-0154-2     Document Type: Article

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