-
1
-
-
0018541427
-
Young's modulus measurements of thin films using micromechanics
-
Kurt E. Petersen and C. R. Guarnieri : “Young's modulus measurements of thin films using micromechanics”, J. Appl. Phys., Vol. 50, No. 11, November, 6761-6766(1979)
-
(1979)
J. Appl. Phys.
, vol.50
, Issue.11
, pp. 6761-6766
-
-
Kurt, E.1
Guarnieri, C.R.2
-
2
-
-
0024771422
-
Mechanical Property Measurements of Thin Films Using Load-Deflection of Composite Rectangular Membranes
-
O. Tabata, K. Kawahata, S. Sugiyama and I. Igarashi : “Mechanical Property Measurements of Thin Films Using Load-Deflection of Composite Rectangular Membranes”, Sensors and Actuators, Vol. 20, 135-141 (1989)
-
(1989)
Sensors and Actuators
, vol.20
, pp. 135-141
-
-
Tabata, O.1
Kawahata, K.2
Sugiyama, S.3
Igarashi, I.4
-
3
-
-
0026875935
-
An improved Tech.nique for determining hardness and elastic modulus using load and displacement sensing indentaion experiments
-
W. C. Oliver and G. M. Pharr : “An improved Tech.nique for determining hardness and elastic modulus using load and displacement sensing indentaion experiments”, J, Mater. Res., Vol. 7, No.6, June 1564-1583(1992)
-
(1992)
J, Mater. Res.
, vol.7
, Issue.6
, pp. 1564-1583
-
-
Oliver, W.C.1
Pharr, G.M.2
-
4
-
-
0024069463
-
Mechanical deflection of cantilever microbeams : A new Tech.nique for testing the mechanical properties of thin films
-
Sep/Oct
-
T. P. Weihs, S. Hong, J. C. Bravman and W. D. Nix : “Mechanical deflection of cantilever microbeams : A new Tech.nique for testing the mechanical properties of thin films, J. Mater. Res., Vol. 3, No.5,Sep/Oct 931-942(1988)
-
(1988)
J. Mater. Res.
, vol.3
, Issue.5
, pp. 931-942
-
-
Weihs, T.P.1
Hong, S.2
Bravman, J.C.3
Nix, W.D.4
-
5
-
-
0030174027
-
Resonant Silicon Accelerometers in Bulk Micromachining Tech.nology -An Approach
-
Christian Burrer, Jaume Esteve and Emilio Lora-Tamayo : “Resonant Silicon Accelerometers in Bulk Micromachining Tech.nology -An Approach”, J. of Microelectromechanical systems Vol.5, No. 2, June, 122-130(1996)
-
(1996)
J. of Microelectromechanical systems
, vol.5
, Issue.2
, pp. 122-130
-
-
Burrer, C.1
Esteve, J.2
Lora-Tamayo, E.3
-
6
-
-
1842698276
-
Application of lead zirconate titanate thin film displacement sensors for the atomic force microscope
-
May/June
-
T. Fujii, Shunji Watanabe, Masatoshi Suzuki and Takamitsu Fujiu : “Application of lead zirconate titanate thin film displacement sensors for the atomic force microscope”, J. Vac. Sci. Tech.nol. B Vol. 13, No. 3, May/June 1119-1122(1995)
-
(1995)
J. Vac. Sci. Tech.nol. B
, vol.13
, Issue.3
, pp. 1119-1122
-
-
Fujii, T.1
Watanabe, S.2
Suzuki, M.3
Fujiu, T.4
-
7
-
-
0032733299
-
Self-excited piezoelectric PZT microcantilevers for dynamic SFM-with inherent sensing and actuating capabilities
-
Chengkuo Lee, Toshihiro Itoh and Tadatomo Suga : “Self-excited piezoelectric PZT microcantilevers for dynamic SFM-with inherent sensing and actuating capabilities”, Sensors and Actuators A 72, 179-188 (1999)
-
(1999)
Sensors and Actuators A
, vol.72
, pp. 179-188
-
-
Lee, C.1
Itoh, T.2
Suga, T.3
-
8
-
-
0029304253
-
Fabrication and characterization of PZT thin-film vibrators for micrometers
-
P. Muralt, M. Kohli, T. Maeder, A. Kholkin, K. Brooks, N. Setter and R. Luthier : “Fabrication and characterization of PZT thin-film vibrators for micrometers”, Sensors and Actuators A 48 157-165(1995)
-
(1995)
Sensors and Actuators A
, vol.48
, pp. 165
-
-
Muralt, P.1
Kohli, M.2
Maeder, T.3
Kholkin, A.4
Brooks, K.5
Setter, N.6
Luthier, R.7
-
9
-
-
0030110294
-
Preparation and Properties of Piezoelectric Lead Zirconate Titanate Thin Films for Microsensors and Microactuators by Sol-Gel Proc.essing
-
Toshiyuki Tuchiya, Toshihiro Itoh, Gen Sasaki and Tadatomo Suga : “Preparation and Properties of Piezoelectric Lead Zirconate Titanate Thin Films for Microsensors and Microactuators by Sol-Gel Proc.essing”, Journal of the Ceramic Society of Japan, Vol. 104, No. 3, 159-163 (1996)
-
(1996)
Journal of the Ceramic Society of Japan
, vol.104
, Issue.3
, pp. 159-163
-
-
Itoh, T.1
Tuchiya, T.2
Sasaki, G.3
Suga, T.4
-
10
-
-
0000912660
-
Characterization of thick lead zirconate titanate films fabricated using a new sol gel based Proc.ess
-
D. A. Barrow T. E. Petroff, R. P. Tandon and M. Sayer : “Characterization of thick lead zirconate titanate films fabricated using a new sol gel based Proc.ess”, J. Appl. Phys. Vol. 81, No. 2, 876-881
-
J. Appl. Phys.
, vol.81
, Issue.2
, pp. 876-881
-
-
Barrow, D.A.1
Petroff, T.E.2
Tandon, R.P.3
Sayer, M.4
-
11
-
-
3643068036
-
Lanthanum-modified lead titanate thin film formed by low-temperature chemical vapor deposition and subsequent annealing
-
21 June
-
Shunji Watanabe, Takamitsu Fujiu and Akira Tanaka : “Lanthanum-modified lead titanate thin film formed by low-temperature chemical vapor deposition and subsequent annealing”, Appl. Phys. Lett., Vol. 62,No. 25, 21 June, 3377-3379(1993)
-
(1993)
Appl. Phys. Lett.
, vol.62
, Issue.25
, pp. 3377-3379
-
-
Watanabe, S.1
Fujiu, T.2
Tanaka, A.3
-
12
-
-
0031099121
-
Piezoelectric properties of c-axis oriented Pb(Zt, Ti)O3 thin films
-
March
-
I. Kanno, S. Fujii, T. Kamada and R. Takayama : “Piezoelectric properties of c-axis oriented Pb(Zt, Ti)O3 thin films”, Applied Physics Letters, Vol. 70, No. 17, March 1997
-
(1997)
Applied Physics Letters
, vol.70
, Issue.17
-
-
Kanno, I.1
Fujii, S.2
Kamada, T.3
Takayama, R.4
-
13
-
-
0033344840
-
Measurement of the effective transverse piezoelectric coefficient e21, f of A1N and Pb(Zrx, Ti1-x)O3 thin films
-
Marc-Alexandre Dubois and Paul Muralt : “Measurement of the effective transverse piezoelectric coefficient e21,f of A1N and Pb(Zrx, Ti1-x)O3 thin films”, Sensors and Actuators, Vol. 77, 106-112 (1999)
-
(1999)
Sensors and Actuators
, vol.77
, pp. 106-112
-
-
Marc-Alexandre, D.1
Muralt, P.2
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