High Voltage and High Resolution Surface Potential Imaging using Scanning Electrostatic Force Microscope

IEEJ Transactions on Sensors and Micromachines

Volumn 117, Issue 12, 1997, Pages 594-599

  Takahashi, Jun ichi ^a   Katoh, Tomomi ^a  

^a RICOH COMPANY LTD   (Japan)

Author keywords

Cantilever; Dielectric Film; High Resolution; High Voltage; Resonant Frequency; Scanning Electrostatic Force Microscope; Surface Potential Imaging

Indexed keywords

EID: 85010106186     PISSN: 13418939     EISSN: 13475525     Source Type: Journal    
DOI: 10.1541/ieejsmas.117.594     Document Type: Article

References (4)

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2. T. Miyasaka, T. Umeda, T. Nagata, and T. Igawa : “High-resolution Measurement of the Electrostatic Latent Image on Photoconductor”, Journal of the Society of the Electrophotography of Japan, Vol.30,No.2,p.123,1991 (in Japanese)
3. Y. Martin, C. C. Williams, and H. K. Wickramasinghe : “Atomic force microscope-force mapping and profiling on a sub 100-A scale”, Journal of Applied Physics, Vol.61, No. 10, p 4723, 1987
4. H. Yokoyama, T. Inoue, and K. Saito : “Surface Potential Imaging of Organic Thin Films by Scanning Maxwell Stress Microscopy”, IECE Tech. Rep. OME 92-3,1992 (in Japanese)