Near infrared thermography with silicon FPA - comparison to MWIR and LWIR thermography

Quantitative InfraRed Thermography Journal

Volumn 3, Issue 1, 2006, Pages 93-115

  Rotrou, Yann ^a   Sentenac, Thierry ^a   Le Maoult, Yannick ^a   Magnan, Pierre ^b   Farré, Jean ^b  

^a ECOLE DES MINES D ALBI CARMAUX   (France)

^b UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

Radiometric model; Silicon FPA; Thermography

Indexed keywords

EID: 85008856878     PISSN: 17686733     EISSN: 21167176     Source Type: Journal    
DOI: 10.3166/qirt.3.93-115     Document Type: Article

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