Development of Measuring Equipment of DC-Biased Magnetic Properties Using Open-Type Single-Sheet Tester

IEEE Transactions on Magnetics

Volumn 42, Issue 10, 2006, Pages 2846-2848

  Miyagi, Daisuke ^a   Yoshida, Tsutomu ^a   Nakano, Masanori ^a   Takahashi, Norio ^a  

^a OKAYAMA UNIVERSITY   (Japan)

Author keywords

DC biased magnetic property; iron loss; single sheet tester (SST)

Indexed keywords

EID: 85008066127     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/TMAG.2006.879144     Document Type: Article

References (3)

1. M. Enokizono and Y. Takeshima, “Measurement method on dc-biased magnetic properties of silicon steel sheet,” Trans. IEE Jpn., vol. 119-A, no. 11, pp. 1330–1335, 1999
2. M. Enokizono, Y. Takeshima, and H. Matsuo, “Measuring magnetic properties under dc-biased magnetization using single-sheet tester,” J. Magn. Soc. Jpn., vol. 24, no. 4-2, pp. 875–878, 2000
3. T. Nakase, M. Nakano, K. Fujiwara, and N. Takahashi, “Single sheet tester having open magnetic path for measurement of magnetostriction of electrical steel sheet,” IEEE Trans. Magn., vol. 35, no. 5, pp. 3956–3958, Sep. 1999