Characterization of the Linearity of Response and Spatial Uniformity of Response of Two InGaAsP/InP Geiger-Mode Avalanche Photodiodes

IEEE Journal of Quantum Electronics

Volumn 46, Issue 11, 2010, Pages 1561-1567

  Theocharous, Evangelos ^a   Cheung, Jessica ^a   Chunnilall, Christopher J ^a   Itzler, Mark A ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b PRINCETON LIGHTWAVE INC   (United States)

Author keywords

Avalanche photodiode; linearity of response; photon counting; spatial uniformity

Indexed keywords

EID: 85008065103     PISSN: 00189197     EISSN: 15581713     Source Type: Journal    
DOI: 10.1109/JQE.2010.2053196     Document Type: Article

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