Reduction of Ru underlayer thickness for CoCrPt-SiO2perpendicular recording media

IEEE Transactions on Magnetics

Volumn 42, Issue 10, 2006, Pages 2381-2383

  Das, Anirban ^b   Racine, Michael ^b   Cheng, Randy ^b  

^a UNIVERSITY OF MINNESOTA   (United States)

^b Heraeus Incorporated Arizona   (United States)

Author keywords

CoCrPt SiO2 perpendicular media; exchange de coupling; intermediate layer; perpendicular magnetic recording media; residual gas; Ru underlayer; surface roughness; Ta seedlayer; X ray reflectivity

Indexed keywords

EID: 85008060969     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/TMAG.2006.878685     Document Type: Article

References (9)

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