Integration and Test Sequencing for Complex Systems

IEEE Transactions on Systems, Man, and Cybernetics Part A: Systems and Humans

Volumn 39, Issue 1, 2009, Pages 177-187

  Boumen, Roel ^a   de Jong, Ivo S M ^a,b   Mestrom, J M G ^c   van de Mortel Fronczak, J M ^b   Rooda, J E ^b  

^a ASML   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c OCÉ TECHNOLOGIES B V   (Netherlands)

Author keywords

Integration; manufacturing machines; semiconductor industry; test sequencing; test strategy

Indexed keywords

EID: 85008054096     PISSN: 10834427     EISSN: 15582426     Source Type: Journal    
DOI: 10.1109/TSMCA.2008.2006374     Document Type: Article

References (12)

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