SURE-Based Non-Local Means

IEEE Signal Processing Letters

Volumn 16, Issue 11, 2009, Pages 973-976

  Van De Ville, Dimitri ^a   Kocher, Michel ^b  

^a UNIVERSITY OF GENEVA   (Switzerland)

^b EPFL   (Switzerland)

Author keywords

Denoising; non local means; Stein's unbiased risk estimate

Indexed keywords

EID: 85008044314     PISSN: 10709908     EISSN: 15582361     Source Type: Journal    
DOI: 10.1109/LSP.2009.2027669     Document Type: Article

References (19)

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