Experimental study of perpendicular write heads at data rates beyond 2 Gb/s

IEEE Transactions on Magnetics

Volumn 42, Issue 10, 2006, Pages 2425-2427

  Zhu, Jian Gang ^b  

^a Headway Technologies Inc   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

High data rate; perpendicular recording; switching dynamics

Indexed keywords

EID: 85008019113     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/TMAG.2006.878677     Document Type: Article

References (6)

1. J.-G. Zhu and D. Z. Bai, “Understanding field rise time and magnetic damping in thin film recording heads Understanding field rise time and magnetic damping in thin film recording heads,” J. Appl. Phys., vol. 93, no. 10, p. 6447, 2003.
2. W. Scholz and S. Batra, “Micromagnetic modeling of head field rise time for high data-rate recording,” IEEE Trans. Magn., vol. 41, no. 2, p. 702, Feb. 2005.
3. G. Ju et al., “High frequency dynamics of soft underlayer in perpendicular recording system,” J. Appl. Phys., vol. 91, no. 10, p. 8052, 2002.
4. B. Valcu and H. N. Bertram, “Soft underlayer magnetization dynamics,” IEEE Trans. Magn., vol. 40, no. 4, p. 2377, Jul. 2004.
5. Y. Zhou and J.-G. Zhu, “Effect of pole-tip size on perpendicular recording head remanence,” IEEE Trans. Magn., vol. 41, no. 12, p. 4449, Dec. 2005.
6. Y. Zhou, J.-G. Zhu, Y.-S. Tang, and L. Guan, “Perpendicular write head remanence characterization using a contact scanning recording tester,” J. Appl. Phys., vol. 97, no. 10, pp. 10N903-10N903-3, 2005.