Magnetization Relaxation in Sputtered Thin Fe Films: An FMR Study

IEEE Transactions on Magnetics

Volumn 42, Issue 10, 2006, Pages 2930-2932

  Kuanr, Bijoy K ^a,b   Kuanr, Alka V ^c   Camley, R E ^a   Celinski, Z ^a  

^a UNIVERSITY OF COLORADO   (United States)

^b UNIVERSITY OF DELHI   (India)

^c UNIVERSITY OF DELHI   (India)

Author keywords

Damping; magnetic films; microwave measurements; thin films

Indexed keywords

EID: 85008008171     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/TMAG.2006.878408     Document Type: Article

References (9)

1. R. Urban et al., Phys. Rev. B, vol. 65, p. 20402, 2002.
2. A. Azevedo et al., Phys. Rev. B, vol. 62, p. 5331, 2000.
3. W. Platow et al., Phys. Rev. B, vol. 58, p. 5611, 1998.
4. S. Mizukami, J. Mag. Mag. Mater., pp. 226–230, 2001. 1640.
5. R. Arias and D. L. Mills, Phys. Rev. B, vol. 60, p. 7395, 1999.
6. Y. Tserkovnyak, A. Brataas, and G. E. W. Bauer, Phys. Rev. B, vol. 66, p. 224403, 2002.
7. E. Simanek and B. Heinrich, Phys. Rev. B, vol. 67, p. 144418, 2003.
8. B. K. Kuanr, R. E. Camley, and Z. Celinski, J. Appl. Phys., vol. 95, p. 6610, 2004.
9. B. D. Cullity, Elements of X-Ray Diffraction, 2nd ed. Reading, MA: Addition-Wesley, 1978, ch. 9, p. 284.