Response to James M. Lucas

Technometrics

Volumn 38, Issue 2, 1996, Pages 199-203

  Welch, William J ^a   Buck, Robert J ^b   Sacks, Jerome ^c   Wynn, Henry P ^d   Morris, Max D ^e   Schonlau, Matthias ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

^b National Institute of Statistical Sciences ^*  (United States)

^c NATIONAL INSTITUTE OF ENVIRONMENTAL HEALTH SCIENCES   (United States)

^d UNIVERSITY OF WARWICK   (United Kingdom)

^e OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85006886675     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1996.10484496     Document Type: Article

References (8)

1. Bernardo, M. C., Buck, R., Liu, L., Nazaret, W. A., Sacks, J and Welch, W J. (1992), “Integrated Circuit Design Optimization Using a Sequential Strategy,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, II, 361-372.
2. Box, G. E. P., and Draper, N. R. (1959), “A Basis for the Selection of a Response Surface Design,” Journal of the American Statistical Association, 54, 622-654.
3. Box, G. E. P., and Draper, N. R. (1963), “The Choice of a Second Order Rotatable Design,” Biometrika, 50, 335-352.
4. Cook, R. D., and Nachtsheim, C. J. (1990), “Letters to the Editor: Response to James M. Lucas,” Technometrics, 32, 364-365.
5. Johnson, M. E., Moore, L. M., and Ylvisaker, D. (1990), “Minimax and Maximin Distance Designs,” Journal of Statistical Planning and Inference, 26, 131-148.
6. McKay, M. D., Conover, W. J., and Beckman, R. J. (1979), “A Comparison of Three Methods for Selecting Values of Input Variables in the Analysis of Output From a Computer Code,” Technometrics, 21, 239-245.
7. Morris, M. D., and Mitchell, T. J. (1995), “Exploratory Designs for Computational Experiments,” Journal of Statistical Planning and Inference, 43, 381-402.
8. Yu, T. K., Kang, S. M Sacks, J., and Welch, W. J. (1991), “Parametric Yield Optimization of CMOS Analogue Circuits by Quadratic Statistical Circuit Performance Models,” International Journal of Circuit Theory and Applications, 19, 579-592.