Experimental study of threshold voltage fluctuations using an 8k MOSFET's array

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1993, Pages 41-42

  Mizuno, Tomohisa ^a   Okamura, Jun Ichi ^a   Toriumi, Akira ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85001841209     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.1993.760235     Document Type: Conference Paper

References (3)

1. R.W. Keys. Proc. IEEE. vol. 63. 740 (1975).
2. K. Nishinohara et al., IEEE Trans. Electron Devices. ED-39, 634 (1992).
3. S. Fujii et al. IEEE J. Solid-State Circuits. SC-24. 1170 (1989).