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Volumn , Issue , 2016, Pages
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Concept and first example of TanDEM-X high-resolution DEM
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Author keywords
[No Author keywords available]
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Indexed keywords
RADAR;
SYNTHETIC APERTURE RADAR;
GLOBAL SCALE;
HIGH-RESOLUTION DEM;
LOCAL SCALE;
OPERATIONAL DATA;
PRODUCT CHARACTERISTICS;
PRODUCTION PROCESS;
RELATIVE HEIGHT ERRORS;
TEST SITE;
DATA ACQUISITION;
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EID: 85001018572
PISSN: 21974403
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (18)
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References (4)
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