Cluster validation for unsupervised stochastic model-based image segmentation

Proceedings - International Conference on Image Processing, ICIP

Volumn 2, Issue , 1994, Pages 197-201

  Langan, D A ^a   Modestino, J W ^b   Zhang, Jun ^c  

^a GENERAL ELECTRIC COMPANY   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^c UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXPONENTIAL FUNCTIONS; IMAGE PROCESSING; INFORMATION THEORY; INTEGRATED CIRCUITS; MAXIMUM PRINCIPLE; STOCHASTIC MODELS; STOCHASTIC SYSTEMS;

CLUSTER VALIDATION; EXPECTATION-MAXIMIZATION ALGORITHMS; INFORMATION THEORETIC CRITERION; MODEL FITTING TECHNIQUES; NUMBER OF CLASS; PROCESSING STAGE; TRAINING DATA; UNSUPERVISED SEGMENTATION;

IMAGE SEGMENTATION;

EID: 84997638214     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.1994.413559     Document Type: Conference Paper

References (10)

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