Simple device for small dimension measurement using CCD sensor

12th IMEKO TC4 International Symposium Electrical Measurements and Instrumentation

Volumn , Issue , 2002, Pages 433-437

  Fischer, Jan ^a   Haasz, Vladimír ^a   Radil, Tomáš ^a  

^a CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

CCD sensor; Dimension measurement; Point light source

Indexed keywords

LENSES; LIGHT SOURCES; OPTICAL SYSTEMS; OPTICAL VARIABLES MEASUREMENT;

CCD SENSORS; DIMENSION MEASUREMENTS; LIGHT SOURCE QUALITY; PARALLEL BEAMS; POINT LIGHT SOURCE;

ELECTRIC VARIABLES MEASUREMENT;

EID: 84995537782     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. E. Hecht, “Optics“, Addison-Wesley Readings, 1998
2. P. Cielo, M. Dufour, "Optical inspection in hostile industrial environments: Single sensor vs. Imaging methods", Optomechanical and Electro-Optical Design of Industrial Systems, SPIE Vol. 959, pp. 87-116, 1988