|
Volumn 5, Issue 3, 2000, Pages 60-65
|
High Throughput Screening at the Nano Scale
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 84992810903
PISSN: 22110682
EISSN: 15402452
Source Type: Journal
DOI: 10.1016/S1535-5535(04)00076-0 Document Type: Article |
Times cited : (5)
|
References (2)
|