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Volumn 2003-October, Issue , 2003, Pages 571-575

Line fault location in a distribution network based on K-fault diagnosis method

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; FAILURE ANALYSIS; INTELLIGENT SYSTEMS; LOCATION; NETWORKS (CIRCUITS); ROBOTICS; SIGNAL PROCESSING;

EID: 84991000828     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RISSP.2003.1285637     Document Type: Conference Paper
Times cited : (3)

References (12)
  • 1
    • 0020751893 scopus 로고
    • Node Fault Diagnosis and Design of Testability
    • Z.F.Huang, C.S.Lin and R.W.Liu,"Node Fault Diagnosis and Design of Testability", IEEE Trans. On CAS, Vol. CAS-30, 1983:257.
    • (1983) IEEE Trans. on CAS , vol.CAS-30 , pp. 257
    • Huang, Z.F.1    Lin, C.S.2    Liu, R.W.3
  • 2
    • 0022107260 scopus 로고
    • Fault Diagnosis of Analog Circuits
    • J.W.Bandler and A.E.Salama, "Fault Diagnosis of Analog Circuits", Proc. IEEE, Vol.73, No.8, 1985:1279.
    • (1985) Proc. IEEE , vol.73 , Issue.8 , pp. 1279
    • Bandler, J.W.1    Salama, A.E.2
  • 3
    • 0019567809 scopus 로고
    • Multi-Fault Location of Analog Circuits
    • R.M.Biernachi and J.W.Bandler, "Multi-Fault Location of Analog Circuits", IEEE Trans. On CAS, CAS-28, No.5, 1981:361.
    • (1981) IEEE Trans. on CAS , vol.CAS-28 , Issue.5 , pp. 361
    • Biernachi, R.M.1    Bandler, J.W.2
  • 5
    • 0024123782 scopus 로고
    • Fault Location of Linear Nonreciprocal Circuit with Tolerance
    • Rui Zou, Jin Ming Huang, "Fault Location of Linear Nonreciprocal Circuit with Tolerance". Proc. IEEE Int. Symp. CAS, 1988:1163.
    • (1988) Proc. IEEE Int. Symp. CAS , pp. 1163
    • Zou, R.1    Huang, J.M.2
  • 9
    • 0017982272 scopus 로고
    • Determination of Structure of Multivariable Stochatic Linear System
    • L.C.Suenand R.Liu, "Determination of Structure of Multivariable Stochatic Linear System", IEEE Trans. on Autom. Control, Vol. AC-23, No.3, 1978:458.
    • (1978) IEEE Trans. on Autom. Control , vol.AC-23 , Issue.3 , pp. 458
    • Suen, L.C.1    Liu, R.2
  • 10
    • 84990956497 scopus 로고    scopus 로고
    • Optimum Fault Screening Location of Analog Circuits with Tolerance
    • Orlando, USA, July 14-18
    • th,Conf. SCI, Orlando, USA, July 14-18,2002.
    • (2002) th,Conf. SCI
    • Peng, M.-F.1    He, Y.-G.2
  • 11
    • 7744234664 scopus 로고    scopus 로고
    • Study on K-fault Screen Method in Circuits with Tolerance
    • Peng Min-fang, HE Yi-gang, "Study on K-fault Screen Method in Circuits with Tolerance", Journal of Circuits and Systems, Vol.7, No.2, 2002: 92.
    • (2002) Journal of Circuits and Systems , vol.7 , Issue.2 , pp. 92
    • Peng, M.-F.1    He, Y.-G.2
  • 12
    • 84990908297 scopus 로고    scopus 로고
    • Algorithm for K-fault Fuzzy Screen Diagnosis in Analog Circuits with Tolerance
    • Peng Min-fang, HE Yi-gang, "Algorithm for K-fault Fuzzy Screen Diagnosis in Analog Circuits with Tolerance", Microelectronics and Computer, Vol.19, No.2, 2002: 40.
    • (2002) Microelectronics and Computer , vol.19 , Issue.2 , pp. 40
    • Peng, M.-F.1    He, Y.-G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.