A maximal resolution guided-probe testing algorithm

Proceedings - Design Automation Conference

Volumn , Issue , 1981, Pages 189-195

  Abramovici, Miron ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; ERRORS; COMPUTER PROGRAMMING - SUBROUTINES;

DIAGNOSTIC RESOLUTION; TESTING ALGORITHM; TESTING PROCEDURE;

PROBES; AUTOMATIC TESTING;

EID: 84990699498     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/dac.1981.1585351     Document Type: Conference Paper

References (5)

1. M. Abramovici and M. A. Breuer: "Fault Diagnosis based on Effect-Cause Analysis: an Introduction", Proc. 17th Design Automation Conference, pp. 69-76, June 1980.
2. M. Abramovici: "Fault Diagnosis in Digital Circuits based on Effect-Cause Analysis", University of Southern California, Electronic Sciences Laboratory Report 508, June 1980.
3. W. A. Johnson, "An Automated Probing Procedure for Board Testing", Proc. Nth Design Automation Conference, pp. 205-213, June 1976.
4. W. A. Groves, "Rapid Digital Fault Isolation with FASTRACE", Hewlett-Packard Journal, pp. 8-13, March 1979.
5. L. M. Zobniw, "Multi-defect Real Time Diagnosis using a Single Pin Probe", Proc. 14th Design Automation Conference, pp. 179-184, June 1976.