Current status and future directions for in situ transmission electron microscopy

Ultramicroscopy

Volumn 170, Issue , 2016, Pages 86-95

  Taheri, Mitra L ^a   Stach, Eric A ^b   Arslan, Ilke ^c   Crozier, P A ^d   Kabius, Bernd C ^e   LaGrange, Thomas ^f   Minor, Andrew M ^g   Takeda, Seiji ^h   Tanase, Mihaela ⁱ   Wagner, Jakob B ^j   Sharma, Renu ⁱ  

^a Drexel University   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^d Arizona State University   (United States)

^e PENNSYLVANIA STATE UNIVERSITY   (United States)

^f LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^g University of California Berkeley   (United States)

^h OSAKA UNIVERSITY   (Japan)

ⁱ NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^j TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

more..

Author keywords

Direct electron detectors; DTEM; ETEM; Gas liquid solid interactions; Heating holder; In situ TEM; Indentation holder; Liquid gas cell holder; Phase transformation; Structure property relationship

Indexed keywords

ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOTECHNOLOGY; PHASE TRANSITIONS; TRANSMISSION ELECTRON MICROSCOPY;

DTEM; ELECTRON DETECTORS; ETEM; IN-SITU TEM; STRUCTURE PROPERTY RELATIONSHIPS;

IN SITU PROCESSING;

GOVERNMENT; HEATING; HUMAN; SCIENTIST; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84989917741     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2016.08.007     Document Type: Review

References (54)

1. [1] Sinclair, R., In situ high-resolution transmission electron microscopy of material reactions. Mrs Bull. 38:12 (2013), 1065–1071.
2. [2] (http://science.energy.gov/~/media/bes/pdf/reports/files/Future_of_Electron_Scattering.pdf).
3. [3] Sharma, R., Experimental set up for in situ transmission electron microscopy observations of chemical processes. Micron 43:11 (2012), 1147–1155.
4. [4] Ramachandramoorthy, R., Bernal, Rodrigo, Espinosa, Horacio D., Pushing the envelope of in situ transmission electron microscopy. Acs Nano 9:5 (2015), 4675–4685.
5. [5] Wall, M.A., Dahmen, U., An in situ nanoindentation specimen holder for a high voltage transmission electron microscope. Microsc. Res. Tech. 42:4 (1998), 248–254.
6. [6] Xie, D.G., Wang, Z.J., Sun, J., Li, J., Ma, E., Shan, Z.W., In situ study of the initiation of hydrogen bubbles at the aluminium metal/oxide interface. Nat. Mater. 14:9 (2015), 899–903.
7. [7] Shan, Z.W., Mishra, R.K., Asif, S.A.S., Warren, O.L., Minor, A.M., Mechanical annealing and source-limited deformation in submicrometre-diameter Ni crystals. Nat. Mater. 7:2 (2008), 115–119.
8. [8] Demczyk, B.G., Wang, Y.M., Cumings, J., Hetman, M., Han, W., Zettl, A., Ritchie, R.O., Direct mechanical measurement of the tensile strength and elastic modulus of multiwalled carbon nanotubes. Mater. Sci. Eng. a-Struct. Mater. Prop. Microstruct. Process. 334:1–2 (2002), 173–178.
9. [9] Legros, M., Gianola, D.S., Hemker, K.J., In situ TEM observations of fast grain-boundary motion in stressed nanocrystalline aluminum films. Acta Mater. 56:14 (2008), 3380–3393.
10. [10] Kiener, D., Minor, A.M., Source truncation and exhaustion: insights from quantitative in situ TEM tensile testing. Nano Lett. 11:9 (2011), 3816–3820.
11. [11] Creemer, J.F., Helveg, S., Kooyman, P.J., Molenbroek, A.M., Zandbergen, H.W., Sarro, P.M., A MEMS reactor for atomic-scale microscopy of nanomaterials under industrially relevant conditions. J. Micro. Syst. 19:2 (2010), 254–264.
12. [12] Allard, L.F., Overbury, S.H., Bigelow, W.C., Katz, M.B., Nackashi, D.P., Damiano, J., Novel MEMS-based gas-cell/heating specimen holder provides advanced imaging capabilities for in situ reaction studies. Microsc. Microanal. 18:4 (2012), 656–666.
13. [13] Williamson, M.J., Tromp, R.M., Vereecken, P.M., Hull, R., Ross, F.M., Dynamic microscopy of nanoscale cluster growth at the solid-liquid interface. Nat. Mater. 2 (2003), 532–536.
14. [14] Zheng, H.M., Smith, R.K., Jun, Y.W., Kisielowski, C., Dahmen, U., Alivisatos, A.P., Observation of single colloidal platinum nanocrystal growth trajectories. Science 324:5932 (2009), 1309–1312.
15. [15] Kraus, T., de Jonge, N., Dendritic gold nanowire growth observed in liquid with transmission electron microscopy. Langmuir 29:26 (2013), 8427–8432.
16. [16] Evans, J.E., Jungjohann, K.L., Browning, N.D., Arslan, I., Controlled growth of nanoparticles from solution with in situ liquid transmission electron microscopy. Nano Lett. 11:7 (2011), 2809–2813.
17. [17] Xiang, B., Hwang, D.J., Bin In, J., Ryu, S.G., Yoo, J.H., Dubon, O., Minor, A.M., Grigoropoulos, C.P., In situ TEM near-field optical probing of nanoscale silicon crystallization. Nano Lett. 12:5 (2012), 2524–2529.
18. [18] Cavalca, F., Laursen, A.B., Kardynal, B.E., Dunin-Borkowski, R.E., Dahl, S., Wagner, J.B., Hansen, T.W., In situ transmission electron microscopy of light-induced photocatalytic reactions. Nanotechnology, 23(7), 2012.
19. [19] Miller, B.K., Crozier, P.A., System for in Situ UV–visible illumination of environmental transmission electron microscopy samples. Microsc. Microanal. 19:2 (2013), 461–469.
20. [20] Picher, M., Mazzucco, S., Blankenship, S., Sharma, R., Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy. Ultramicroscopy 150 (2015), 10–15.
21. 2 Island Growth on SI Studied by in Situ UHV-TEM. 1998, Iop Publishing Ltd., Bristol, 503–504.
22. [22] J.C. Yang, M.D. Bhardwaj, L. Tropia, J.M. Gibson, The surface kinetics of the initial oxidation stages of copper as investigated by in situ ultra-high vacuum transmission electron microscopy. In High Temperature Corrosion and Protection of Materials 5, Pts 1 and 2, R. Streiff, I.G. Wright, R.C. Krutenat, M. Caillet, A. Galerie, Eds. 2001, 369–3, pp. 133–140.
23. [23] White, E.R., Singer, S.B., Augustyn, V., Hubbard, W.A., Mecklenburg, M., Dunn, B., Regan, B.C., In situ transmission electron microscopy of lead dendrites and lead ions in aqueous solution. Acs Nano 6:7 (2012), 6308–6317.
24. [24] P.R. Swann, N.J. Tighe, Performance of differentially pumped environmental cell in the AE1 EM7, in: Proc. 5th Eur. Reg. Cong Electron Microscopy, 1972, p. 436.
25. [25] Gai, P.L., Environmental high resolution electron microscopy of gas-catalyst reactions. Top. Catal. 8 (1999), 97–113.
26. [26] Sharma, R., An environmental transmission electron microscope for in situ synthesis and characterization of nanomaterials. J. Mater. Res. 20:7 (2005), 1695–1707.
27. [27] Gai, P.L., Sharma, R., Ross, F.M., Environmental (S)TEM studies of gas-liquid-solid interactions under reaction conditions. Mrs Bull. 33:2 (2008), 107–114.
28. [28] Sharma, R., Crozier, Peter, A., Environmental transmission electron microscopy in nanotechnology. Wang, N.Y.Z.L., (eds.) Transmission Electron Microscopy for Nanotechnology, 2005, Springer-Verlag and Tsinghua University Press, 531–565.
29. [29] Battaglia, M., Contarato, D., Denes, P., Doering, D., Duden, T., Krieger, B., Giubilato, P., Gnani, D., Radmilovic, V., Characterisation of a CMOS active pixel sensor for use in the TEAM microscope. Nucl. Instrum. Methods Phys. Res. Sect. A: Accel. Spectrometers Detect. Assoc. Equip. 622:3 (2010), 669–677.
30. [30] Zewail, A.H., 4D ultrafast electron diffraction, crystallography, and microscopy. Annu. Rev. Phys. Chem. 57 (2006), 65–103.
31. [31] Bostanjoglo, O., Horinek, W.R., Pulsed TEM - A new method to detect transient structures in fast phase-transitions. Optik 65:4 (1983), 361–367.
32. [32] Robertson, I.M., Schuh, C.A., Vetrano, J.S., Browning, N.D., Field, D.P., Jensen, D.J., Miller, M.K., Baker, I., Dunand, D.C., Dunin-Borkowski, R., Kabius, B., Kelly, T., Lozano-Perez, S., Misra, A., Rohrer, G.S., Rollett, A.D., Taheri, M.L., Thompson, G.B., Uchic, M., Wang, X.L., Was, G., Towards an integrated materials characterization toolbox. J. Mater. Res. 26:11 (2011), 1341–1383.
33. [33] Taheri, M.L., McGowan, S., Nikolova, L., Evans, J.E., Teslich, N., Lu, J.P., LaGrange, T., Rosei, F., Siwick, B.J., Browning, N.D., In situ laser crystallization of amorphous silicon: controlled nanosecond studies in the dynamic transmission electron microscope. Appl. Phys. Lett., 97(3), 2010.
34. [34] Kim, J.S., LaGrange, T., Reed, B.W., Taheri, M.L., Armstrong, M.R., King, W.E., Browning, N.D., Campbell, G.H., Imaging of transient structures using nanosecond in situ TEM. Science 321:5895 (2008), 1472–1475.
35. [35] LaGrange, T., Armstrong, M.R., Boyden, K., Brown, C.G., Campbell, G.H., Colvin, J.D., DeHope, W.J., Frank, A.M., Gibson, D.J., Hartemann, F.V., Kim, J.S., King, W.E., Pyke, B.J., Reed, B.W., Shirk, M.D., Shuttlesworth, R.M., Stuart, B.C., Torralva, B.R., Browning, N.D., Single-shot dynamic transmission electron microscopy. Appl. Phys. Lett., 89(4), 2006.
36. [36] LaGrange, T., Reed, B.W., Masiel, D.J., Movie-mode dynamic electron microscopy. Mrs Bull. 40:1 (2015), 22–28.
37. [37] LaGrange, T., Reed, B.W., Santala, M.K., McKeown, J.T., Kulovits, A., Wiezorek, J.M.K., Nikolova, L., Rosei, F., Siwick, B.J., Campbell, G.H., Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope. Micron 43:11 (2012), 1108–1120.
38. [38] King, W.E., Campbell, G.H., Frank, A., Reed, B., Schmerge, J.F., Siwick, B.J., Stuart, B.C., Weber, P.M., Ultrafast electron microscopy in materials science, biology, and chemistry. J. Appl. Phys., 97(11), 2005.
39. [39] Jinschek, J.R., Helveg, S., Image resolution and sensitivity in an environmental transmission electron microscope. Micron 43:11 (2012), 1156–1168.
40. [40] R.N. Clough, G. Moldovan, A.I. Kirkland, Direct Detectors for Electron Microscopy. Electron Microscopy and Analysis Group Conference 2013 (Emag2013), 2014, p. 522.
41. [41] McMullan, G., Faruqi, A.R., Clare, D., Henderson, R., Comparison of optimal performance at 300 keV of three direct electron detectors for use in low dose electron microscopy. Ultramicroscopy 147 (2014), 156–163.
42. [42] Panciera, F., Chou, Y.-C., Reuter, M.C., Zakharov, D., Stach, E.A., Hofmann, S., Ross, F.M., Synthesis of nanostructures in nanowires using sequential catalyst reactions. Nat. Mater. 14 (2015), 820–825.
43. [43] Park, J., Elmlund, H., Ercius, P., Yuk, J.M., Limmer, D.T., Chen, Q., Kim, K., Han, S.H., Weitz, D.A., Zettl, A., Alivisatos, A.P., 3D structure of individual nanocrystals in solution by electron microscopy. Science 349:6245 (2015), 290–295.
44. [44] Yamasaki, J., Takeda, S., Tsuda, K., Elemental process of amorphization induced by electron irradiation in Si. Phys. Rev. B, 65, 2002, 11.
45. [45] Vendelbo, S.B., Kooyman, P.J., Creemer, J.F., Morana, B., Mele, L., Dona, P., Nelissen, B.J., Helveg, S., Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy. Ultramicroscopy 133 (2013), 72–79.
46. [46] Winterstein, J., Lin, Pin, Ann, Sharma, R., Temperature calibration for in situ environmental transmission electron microscopy experiments. Microsc. Microanal., 2015, 1–7.
47. [47] Wirtz, T., Phillipp, P., Audinot, J.-N., Dowsett, D., Eswara, S., High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy. Nanotechnology, 26 (434001), 2014, 22.
48. [48] B. Kabius, H. Rose, Novel Aberration Correction Concepts, in: Advances in Imaging and Electron Physics, 153, P.W. Hawkes, Ed. 2008, 153, pp. 261–281.
49. [49] Kabius, B., Hartel, P., Haider, M., Muller, H., Uhlemann, S., Loebau, U., Zach, J., Rose, H., First application of C-c-corrected imaging for high-resolution and energy-filtered TEM. J. Electron Microsc. 58:3 (2009), 147–155.
50. [50] Chenna, S., Crozier, P.A., Operando transmission electron microscopy: a technique for detection of catalysis using electron energy-loss spectroscopy in the transmission electron microscope. Acs Catal. 2:11 (2012), 2395–2402.
51. [51] Crozier, P.A., Hansen, T.W., In situ and operando transmission electron microscopy of catalytic materials. Mrs Bull. 40:1 (2015), 38–45.
52. [52] Vendelbo, S.B., Elkjaer, C.F., Falsig, H., Puspitasari, I., Dona, P., Mele, L., Morana, B., Nelissen, B.J., van Rijn, R., Creemer, J.F., Kooyman, P.J., Helveg, S., Visualization of oscillatory behaviour of Pt nanoparticles catalysing CO oxidation. Nat. Mater. 13:9 (2014), 884–890.
53. [53] Hansen, T.W., Wagner, J.B., Environmental transmission electron microscopy in an aberration-corrected environment. Microsc. Microanal. 18:4 (2012), 684–690.
54. [54] Oshima, Y., Tsuda, Tetsuya, Kuwabata, Susumu, Yasuda, Hidehito, Takayanagi, Kunio, Development of an electrochemical cell for in situ transmission electron microscopy observation. Microscopy 63:6 (2014), 481–486.