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Volumn 41, Issue 2, 1994, Pages 171-187

Tests for transient means in simulated time series

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EID: 84989674833     PISSN: 0894069X     EISSN: 15206750     Source Type: Journal    
DOI: 10.1002/1520-6750(199403)41:2<171::AID-NAV3220410204>3.0.CO;2-N     Document Type: Article
Times cited : (24)

References (24)
  • 8
    • 84989666978 scopus 로고
    • “On Using Standardized Time Series to Analyze Stochastic Processes.” Ph.D, thesis. School of Operations Research and Industrial Engineering. Cornell University. Ithaca. New York.
    • (1984)
    • Goldsman, D.1
  • 14
    • 0007947949 scopus 로고
    • Simple Models for Positive‐Valued and Discrete‐Valued Time Series with ARMA Correlation Structure
    • P. K. Krishnaiah, North Holland, New York
    • (1980) Multivariate Analysis—V , pp. 151-166
    • Lewis, P.A.W.1
  • 15
    • 0021640537 scopus 로고
    • “Overlapping Batch Means: Something for Nothing?” Proceedings of the 1984 Winter Simulation Conference.
    • (1984) , pp. 227-230
    • Meketon, M.S.1    Schmeiser, B.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.