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Volumn , Issue , 1982, Pages 629-635

Synchronous path analysis in MOS circuit simulator

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATION; COMPUTER AIDED DESIGN; ELECTRIC CLOCKS; REGRESSION ANALYSIS;

EID: 84989466311     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.1982.1585562     Document Type: Conference Paper
Times cited : (27)

References (13)
  • 1
    • 0017791010 scopus 로고
    • Design verification and performance analysis
    • Las Vegas, Nevada, June 19-21
    • M. A. Wold, "Design verification and performance analysis," Proceedings of 15th Design Automation Conference, Las Vegas, Nevada, June 19-21, 1978, pp. 264-270.
    • (1978) Proceedings of 15th Design Automation Conference , pp. 264-270
    • Wold, M.A.1
  • 2
    • 0018996711 scopus 로고
    • An experimental delay test generator for LSI logic
    • March
    • J. D. Lesser and J. J. Shedletsky, "An experimental delay test generator for LSI logic," IEEE Transactions on Computers, Vol. C-29, pp. 235-248, March 1980.
    • (1980) IEEE Transactions on Computers , vol.C-29 , pp. 235-248
    • Lesser, J.D.1    Shedletsky, J.J.2
  • 4
    • 0019243185 scopus 로고
    • The SCALD timing verifier: A new approach to timing constraints in large digital systems
    • Houston, Texas, April 28-30
    • T. M. McWilliams, "The SCALD timing verifier: A new approach to timing constraints in large digital systems," Proceedings of IEEE International Symposium on Circuits and Systems, Houston, Texas, April 28-30, 1980, pp. 415-423.
    • (1980) Proceedings of IEEE International Symposium on Circuits and Systems , pp. 415-423
    • McWilliams, T.M.1
  • 5
    • 85043316911 scopus 로고
    • Verification of timing constraints on large digital systems
    • Minneapolis, MN, June 23-25 also J. Digital Systems pp. 401-427
    • T. M. McWilliams, "Verification of timing constraints on large digital systems," Proceedings of 17th Design Automation Conference, Minneapolis, MN, June 23-25, 1980, pp. 139-147 (also J. Digital Systems, Vol. V, pp. 401-427, 1981).
    • (1980) Proceedings of 17th Design Automation Conference , vol.5 , pp. 139-147
    • McWilliams, T.M.1
  • 7
    • 0019266434 scopus 로고
    • Statistical analysis techniques for predicting the delay variation of VLSI logic circuits
    • Port Chester, N.Y., October 1-3
    • B. G. Craft, "Statistical analysis techniques for predicting the delay variation of VLSI logic circuits," Proceedings of IEEE International Conference on Circuits and Computers, Port Chester, N.Y., October 1-3, 1980, pp. 574-577.
    • (1980) Proceedings of IEEE International Conference on Circuits and Computers , pp. 574-577
    • Craft, B.G.1
  • 10
    • 85050906316 scopus 로고
    • A timing verification system based on extracted MOS/VLSI circuit parameters
    • Nashville, TN, June 29-July 1
    • P. Ng, W. Glauert, and R. Kirk, "A timing verification system based on extracted MOS/VLSI circuit parameters," Proceedings of 18th Design Automation Conference, Nashville, TN, June 29-July 1, 1981, pp. 288-292.
    • (1981) Proceedings of 18th Design Automation Conference , pp. 288-292
    • Ng, P.1    Glauert, W.2    Kirk, R.3
  • 11
    • 0020303750 scopus 로고
    • Timing verification of VLSI logic circuits
    • Cambridge, Mass., January 25-27 (Deaham, MA; Artech House, Inc.)
    • D. W. McSweeney, "Timing verification of VLSI logic circuits," Proceedings of Conference on Advanced Research in VLSI, Cambridge, Mass., January 25-27, 1982, pp. 63-66. (Deaham, MA; Artech House, Inc.).
    • (1982) Proceedings of Conference on Advanced Research in VLSI , pp. 63-66
    • McSweeney, D.W.1
  • 13
    • 2342528960 scopus 로고
    • A multiple delay simulator for MOS LSI circuits
    • Minneapolis, MN, June 23-25
    • H. N. Nham and A. K. Bose, "A multiple delay simulator for MOS LSI circuits," Proceedings of 17th Design Automation Conference, Minneapolis, MN, June 23-25, 1980, pp. 610-617.
    • (1980) Proceedings of 17th Design Automation Conference , pp. 610-617
    • Nham, H.N.1    Bose, A.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.