A -55 to +200°C 12-bit analog-to-digital converter

High-Temperature Electronics

Volumn , Issue , 1998, Pages 784-789

  Prazak, Paul R ^a  

^a Burr Brown   (United States)

Author keywords

Clocks; Converters; Gold; Resistors; RNA; Temperature distribution

Indexed keywords

EID: 84988748653     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1109/9780470544884.ch99     Document Type: Chapter

References (10)

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2. R. W. Webb, in ISSCC Dig. of Tech. Papers, p. 142, 1978.
3. J. G. Graeme, Operational Amplifiers, Design & Applications. New York: McGraw-Hill, 1971, pp. 230-231.
4. S. J. Gillespie, “Stability of lateral pnp transistors during accelerated aging,” IBM, J. Res. Develop., vol. 23, no. 6, Nov. 1979.
5. J. L. Prince, E. A. Rapp, J. W. Kronberg, and L. T. Fitch, “High temperature characteristics of commercial integrated circuits,” High Temperature Electronics and Instrumentation Seminar Proc, Sandia Lab., Dec. 3-4, 1979.
6. J. R. Black, “Electromigration, a brief survey and some recent results,” IEEE Trans. Electron Devices, vol. ED-16, pp. 338-347, Apr. 1969.
7. P. Prazak and A. Mrozowski, “Correcting errors digitally in data acquisition and control,” Electronics, Nov. 22, 1979.
8. D. S. Peck and H. Zierdt, “The reliability of semiconductor devices in the Bell System”, in Proc. IEEE, vol. 62, pp. 185-211, Feb. 1974.
9. J. Giusti, “ADC10HT life test report,” Burr-Brown Research Corp., Mar. 19, 1981.
10. Microcircuit Manufacturing Control Handbook-Guide to Failure Analysis and Process Control, vol. 1, 2nd ed., Integrated Circuit Engineering Corp., p. 310.