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Volumn , Issue , 2014, Pages 1-571
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Scanning transmission electron microscopy of nanomaterials: Basics of imaging and analysis
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ABERRATIONS;
ELECTRON ENERGY LEVELS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON SCATTERING;
ENERGY DISSIPATION;
NANOSTRUCTURED MATERIALS;
SCANNING ELECTRON MICROSCOPY;
STEM (SCIENCE, TECHNOLOGY, ENGINEERING AND MATHEMATICS);
STUDENTS;
TRANSMISSION ELECTRON MICROSCOPY;
ADVANCED TECHNOLOGY;
FUTURE PROSPECTS;
GRADUATE STUDENTS;
HIGH RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPIES;
HIGH SENSITIVITY;
PRESENT STATUS;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
SPHERICAL ABERRATION CORRECTION;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
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EID: 84988643122
PISSN: None
EISSN: None
Source Type: Book
DOI: 10.1142/P807 Document Type: Book |
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Times cited : (22)
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References (0)
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