Conducting Interface in Oxide Homojunction: Understanding of Superior Properties in Black TiO2

Nano Letters

Volumn 16, Issue 9, 2016, Pages 5751-5755

  Lü, Xujie ^a   Chen, Aiping ^a   Luo, Yongkang ^a   Lu, Ping ^b   Dai, Yaomin ^a   Enriquez, Erik ^a   Dowden, Paul ^a   Xu, Hongwu ^a   Kotula, Paul G ^b   Azad, Abul K ^a   Yarotski, Dmitry A ^a   Prasankumar, Rohit P ^a   Taylor, Antoinette J ^a   Thompson, Joe D ^a   Jia, Quanxi ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Black TiO2; enhanced electron transport; interfacial engineering; metallic conduction; oxide interfaces; thin films

Indexed keywords

AMORPHOUS FILMS; CRYSTALLINE MATERIALS; ELECTRON TRANSPORT PROPERTIES; INTERFACES (MATERIALS); METALLIC COMPOUNDS; NANOPARTICLES; OXIDE FILMS; THIN FILMS;

CONDUCTING INTERFACE; ELECTRON TRANSPORT; ELECTRONIC INTERFACE; FUNDAMENTAL MECHANISMS; INHERENT COMPLEXITY; METALLIC CONDUCTION; OPTOELECTRONIC PROPERTIES; OXIDE INTERFACES;

TITANIUM DIOXIDE;

EID: 84987728110     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/acs.nanolett.6b02454     Document Type: Article

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