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Volumn 48, Issue 1, 1978, Pages K55-K58
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Investigation of radiation defects in GaAs by means of schottky diode characteristics
a
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84987145524
PISSN: 00318965
EISSN: 1521396X
Source Type: Journal
DOI: 10.1002/pssa.2210480150 Document Type: Article |
Times cited : (9)
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References (7)
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