Limits of topographic measurement by the scanning tunnelling and atomic force microscopes

Journal of Microscopy

Volumn 152, Issue 3, 1988, Pages 611-618

  Stedman, M ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

AFM; amplitude; limits; measurement; metrology; microscope; profile; scanning; STM; surface; topography; wavelength

Indexed keywords

EID: 84986703649     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.1988.tb01428.x     Document Type: Article

References (8)

1. An algorithm for surface reconstruction in scanning tunneling microscopy
2. Mono‐atomic tips for scanning tunneling microscopy
3. Grazing incidence optics: amplitude‐wavelength mapping as a unified approach to specification, theory and metrology
4. Theoretical studies for scanning tunneling microscopy
5. Basis for comparing the performance of surface‐measuring machines
6. Mapping the performance of surface‐measuring instruments
7. Wide range STM
8. The Topografiner: an instrument for measuring surface microtopography