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Volumn 6, Issue 2, 1985, Pages 151-156

Stressful events, stressors and psychological strains in young professional engineers

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EID: 84986641943     PISSN: 08943796     EISSN: 10991379     Source Type: Journal    
DOI: 10.1002/job.4030060206     Document Type: Article
Times cited : (141)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.