Stress Measurement in Single‐Crystal and Polycrystalline Ceramics Using Their Optical Fluorescence

Journal of the American Ceramic Society

Volumn 76, Issue 6, 1993, Pages 1433-1440

  Ma, Qing ^a   Clarke, David R ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84986409331     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1993.tb03922.x     Document Type: Article

References (15)

1. Measurement of Local Stress in Laser Recrystallized Lateral Epitaxial Silicon Films over Silicon Dioxide Using Raman Scattering
2. 3
3. Pressure Measurement Made by the Utilization of Ruby Sharp Line Luminescence
4. Fine Structure and Properties of Chromium Fluorescence in Aluminum and Magnesium Oxide
5. 3
6. Measurement of Stresses Using Fluorescence in an Optical Microprobe: Stresses Around Indentations in a Chromium‐Doped Sapphire
7. Strain‐Induced Effects on the Degenerate Spectral Line of Chromium in MgO Crystals
8. Measurement of the Crystallographically Transformed Zone Produced by Fracture in Ceramics Containing Tetragonal Zirconia
9. Raman Microprobe Spectroscopy of Ceramics
10. Pressure Measurement at High Temperatures in the Diamond Anvil Cell
11. Model Line‐Shape Analysis for the Ruby R Lines Used for Pressure Measurement
12. 3)
13. 3