Structure and properties of ANOF Layers

Crystal Research and Technology

Volumn 19, Issue 1, 1984, Pages 93-99

  Dittrich, K H ^a   Krysmann, W ^a   Kurze, P ^a   Schneider, H G ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84985846351     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.2170190117     Document Type: Article

References (9)

1. Al-Al2O3interface study using surface soft-x-ray absorption and photoemission spectroscopy