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Volumn 45, Issue 3, 1994, Pages 210-216

Structural investigation of phthalocyaninatopoly(siloxane) Langmuir–Blodgett films by X‐ray diffraction

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84985594998     PISSN: 03237648     EISSN: 15214044     Source Type: Journal    
DOI: 10.1002/actp.1994.010450312     Document Type: Article
Times cited : (11)

References (23)
  • 6
    • 0012261578 scopus 로고
    • Herstellung ultradünner Schichten mit molekular kontrollierten Aufbau aus polymeren Phthalocyaninen mit der Langmuir-Blodgett-Technik
    • (1986) Angewandte Chemie , vol.98 , pp. 1114
    • Orthmann, E.1    Wegner, G.2
  • 9
  • 18
    • 84985544892 scopus 로고    scopus 로고
    • Ultra‐thin silicon wafers were supplied by Virginia Semiconductors, Inc., 1501 Powhatan ST., Fredericksburg, VA 22401, USA.
  • 19
    • 0003613926 scopus 로고
    • Structure of Liquid Crystal Phases
    • See, for instance, World Scientific, Singapore
    • (1988)
    • Pershan, P.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.