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ZAAC ‐ Journal of Inorganic and General Chemistry

Volumn 608, Issue 2, 1992, Pages 88-99

Isothiocyanat‐Komplexe von Kupfer (II) mit quadratisch‐planarer und tetragonal‐pyramidaler Koordination: Struktur, Phasenumwandlungen und Redoxverhalten

(4) Wilk, A a Massa, W a Friebel, C a Reinen, D a

a PHILIPPS UNIVERSITY MARBURG (Germany)

Author keywords

Copper(II) isothiocyanate complexes; EPR Spectra; phase transitions; redox properties; Structure

Indexed keywords

EID: 84983921306 PISSN: 00442313 EISSN: 15213749 Source Type: Journal
DOI: 10.1002/zaac.19926080214 Document Type: Article

Times cited : (10)

References (14)

1
- 0006301996
- (1983) Comments Inorg. Chem. , vol.2 , pp. 227
- Reinen, D.¹

2
- 0002923988
- (1989) Chem. Phys. , vol.136 , pp. 27
- Reinen, D.¹ Atanasov, M.²

3
- 0003977129
- A. M. Golub, H. Köhler, V. V. Skopenko, Elsevier
- (1986) Chemistry of Pseudohalides

4
- 0005285390
- (1965) Inorg. Chem. , vol.4 , pp. 823
- Forster, D.¹ Goodgame, D.M.L.²

5
- 84989092775
- (1987) Z. anorg. allg. Chem. , vol.648 , pp. 7
- Reinen, D.¹ Allmann, R.² Baum, G.³ Jakob, B.⁴ Kaschuba, U.⁵ Massa, W.⁶ Miller, J.G.⁷

6
- 0000757842
- (1981) Chem. , vol.20 , pp. 1304
- Vijaya, S.¹ Manoharan, P.T.²

7
- 84983938505
- (1976) PARAM, Programm zur Verfeinerung von Gitterparametern aus X‐Ray , vol.76
- Alden, R.A.¹ Ammon, A.L.² Mauer, F.³

8
- 84983938496
- SHELXTL‐76, Program for Crystal Structure Determination, Cambridge
- (1976)
- Sheldrick, G.M.¹

9
- 84912959805
- SHELXTL‐Plus
- Siemens Analytical X‐Ray Instruments, Inc., Madison, Wisconsin, USA
- (1989) Release 4.0 for Siemens R3 Crystallographic Research Systems
- Sheldrick, G.M.¹

10
- 84980073071
- X-ray scattering factors computed from numerical Hartree–Fock wave functions
- A 24
- (1968) Acta Crystallographica Section A , pp. 321
- Cromer, D.T.¹ Mann, J.D.²

11
- 0002649888
- Table 2. 2B;, Birmingham, Kynoch Press
- (1974) International Tables for X‐Ray Crystallography , vol.4
- Cromer, D.T.¹ Waber, J.T.²

12
- 84984034786
- ORTEP, A Fortran Thermal Ellipsoid Plot Program for Crystal Structure Illustrations, Report ORNL‐3794, Oak Ridge, Tennesse
- (1965)
- Johnson, C.K.¹

13
- 0003200845
- (1988) Adv. Materials/Angew. Chem. , vol.100 , pp. 1817
- Inokuchi, H.¹

14
- 84984046784
- in Vorbereitung
- Reinen, D.¹ Friebel, C.² Atanasov, M.³ Jakob, B.⁴ Wilk, A.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.