Commercial devices in space-single event effects on earth

36th AIAA Aerospace Sciences Meeting and Exhibit

Volumn , Issue , 1998, Pages

  Fogarty, T N ^a   You, Z ^a   Attia, J ^a   Wilkins, R ^a   Washington, K ^a   Kouba, C ^b   Lawton, R ^c  

^a USA   (United States)

^b NASA HEADQUARTERS   (United States)

^c Space Environment Consulting ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSPACE ENGINEERING; EARTH (PLANET); NASA; RADIATION EFFECTS;

COMMERCIAL APPLICATIONS; COMMERCIAL DEVICES; COMMERCIAL GRADE; DEVICE GEOMETRIES; ECONOMIC CONSIDERATIONS; SINGLE EVENT EFFECTS; SPECIFIC CAPACITANCE; TERRESTRIAL ENVIRONMENTS;

SEMICONDUCTOR DEVICES;

EID: 84983120500     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2514/6.1998-296     Document Type: Conference Paper

References (11)

1. T. N. Fogarty "Process and Radiation Induced Defects in Electronic Materials and Devices" Invited paper ACerS May 1995, published in "Crystal Growth of Novel Electronic Materials," Ceramic Transactions, Volume 60.
2. J. F. Ziegler and G. R. Srinivasan, eds., IBM J. Res. Dev., January 1996.
3. C. Lage, D. Bumett, Thomas Mcnelly, K. Baker, A. Bormann, D. Dreier, V. Soorholtz, "Soft Error Rate and Stored Charge Requirements in Advanced High Density SRAMs," ĽEDM 93-821, page 33. 4. 1.
4. N. Kemess, A. Taber, "Neutron SEU Trends in Avionics," IEEE Radiation Effects Data Workshop. July 1997.
5. C. Lage, J. D. Hayden, C. Subramanian, "Advanced SRAM Technology-The Race Between 4T and 6T Cells," ĽEDM 96-271, IEEE.
6. Z. You, "SRAM Single Event Upset Dependence on Accelerator Tvpe. Beam Arrival Angle(+/-), and Ion Species" MS Thesis, PVAMU/CEA August 1995.
7. th NASA Symposium on VLSI design 1997.
8. F. Eshete. "Radiation Hardening of CMOS SRAM Using Switched Capacitor Networks" MS Thesis, Prairie View A& M University, August 1993.
9. th Annual International NSREC 1997.
10. "PC/104 Resource Guide," April 1996, Ninth Edition.
11. C. Kouba, "The Single Event Effect Characteristics of the 486-DX4 Microprocessor" MS Thesis, Texas A&M University.