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Volumn 22, Issue 3, 1993, Pages 160-162

Method for quantitative XRF analysis of inhomogeneous thin specimens

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84981775252     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1300220309     Document Type: Article
Times cited : (5)

References (7)
  • 6
    • 84981803349 scopus 로고
    • A method of correction for absorption matrix effects in samples of ‘intermediate’ thickness in EDXRF analysis
    • (1979) X-Ray Spectrometry , vol.8 , pp. 14
    • Markowicz, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.