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X‐Ray Spectrometry

Volumn 12, Issue 1, 1983, Pages 30-37

Quantitative x‐ray fluorescence analysis by use of fundamental influence coefficients

(2) Broll, N a Tertian, R b

a SIEMENS AG (Germany)

b NONE (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84981767854 PISSN: 00498246 EISSN: 10974539 Source Type: Journal
DOI: 10.1002/xrs.1300120108 Document Type: Article

Times cited : (37)

References (18)

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3
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4
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- Heyden, London
- (1982) Principles of Quantitative X‐Ray Fluorescence Analysis
- Tertian, R.¹ Claisse, F.²

5
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- 4ème Colloque International sur les Méthodes Analytiques par Rayonnements X, Strasbourg, Preprints, p.
- (1977) , pp. 113
- Tertian, R.¹

6
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- Crossed influence coefficients for accurate X-ray fluorescence analysis of multicomponent systems
- (1977) X-Ray Spectrometry , vol.6 , pp. 123
- Tertian, R.¹ Le Sage²

7
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- Plenum, New York
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- Criss, J.W.¹

8
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9
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- X-Ray secondary fluorescence in matrix correction
- (1979) X-Ray Spectrometry , vol.8 , pp. 114
- Plesch, R.¹

10
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- Influence of interelement effects on x-ray fluorescence calibration curve coefficients for binary mixtures
- (1982) X-Ray Spectrometry , vol.11 , pp. 70
- Mainardi, R.T.¹ Fernandez, J.E.² Nores, M.³

11
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- (1967) Can. Spectros. , vol.12 , pp. 129
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12
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- Plenum, New York
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13
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- A new approach to the study and control of interelement effects in the X-ray fluorescence analysis of metal alloys and other multi-component systems
- (1973) X-Ray Spectrometry , vol.2 , pp. 95
- Tertian, R.¹

14
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- Concerning interelemental crossed effects in X-ray fluorescence analysis
- (1974) X-Ray Spectrometry , vol.3 , pp. 102
- Tertian, R.¹

15
- 0344309894
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- Tertian, R.¹

16
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- Gilfrich, J.V.¹ Birks, L.S.²

17
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- (1982) X‐Ray Software Rev. , vol.1 , pp. 1
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18
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- X-ray fluorescence analysis applying theoretical matrix corrections. Stainless steel
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.