Substituent Effects on the [N-I-N]+ Halogen Bond

Journal of the American Chemical Society

Volumn 138, Issue 31, 2016, Pages 9853-9863

  Carlsson, Anna Carin C ^a,e   Mehmeti, Krenare ^a   Uhrbom, Martin ^a,f   Karim, Alavi ^a   Bedin, Michele ^a,g   Puttreddy, Rakesh ^c   Kleinmaier, Roland ^a,h   Neverov, Alexei A ^b,i   Nekoueishahraki, Bijan ^a   Gräfenstein, Jürgen ^a   Rissanen, Kari ^c   Erdélyi, Máté ^a,d  

^a UNIVERSITY OF GOTHENBURG   (Sweden)

^b QUEEN S UNIVERSITY   (Canada)

^c UNIVERSITY OF JYVÄSKYLÄ   (Finland)

^d Swedish NMR Centre   (Sweden)

^e Department of Environmental and Radiological Health Sciences   (United States)

^f ASTRAZENECA R AND D   (Sweden)

^g UPPSALA UNIVERSITY   (Sweden)

^h LANXESS DEUTSCHLAND GMBH   (Germany)

ⁱ AFTON CHEMICAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOND LENGTH; CARRIER CONCENTRATION; CHEMICAL SHIFT; COMPUTATIONAL METHODS; ELECTRON DENSITY MEASUREMENT; ELECTRONS; FLUORINE; HALOGEN COMPOUNDS; NITROGEN; PYRIDINE; SINGLE CRYSTALS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

ELECTRON DEFICIENCY; ELECTRON POPULATION; ELECTRONIC EFFECTS; ELECTRONWITHDRAWING; SINGLE CRYSTAL X-RAY DIFFRACTION; SUBSTITUENT EFFECT; SYNTHETIC REAGENTS; SYSTEMATIC CHANGES;

IODINE;

FLUORINE; HALOGEN; IODINE; NITROGEN; NITROGEN DIOXIDE; PYRIDINE;

ARTICLE; CHEMICAL BOND; CHEMICAL REACTION KINETICS; CRYSTAL; DENSITY; ELECTRON; HALOGEN BOND; MODULATION; NITROGEN NUCLEAR MAGNETIC RESONANCE; X RAY DIFFRACTION;

EID: 84981539905     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/jacs.6b03842     Document Type: Article

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