SCOPUS 정보 검색 플랫폼

Volumn , Issue , 2016, Pages 3956-3966

Effects of Pb Intercalation on the Structural and Electronic Properties of Epitaxial Graphene on SiC

(10) Yurtsever, Ayhan a Onoda, Jo a,b Iimori, Takushi b Niki, Kohei a,b Miyamachi, Toshio b Abe, Masayuki a Mizuno, Seigi c Tanaka, Satoru c Komori, Fumio b Sugimoto, Yoshiaki a,b

a OSAKA UNIVERSITY (Japan)

b UNIVERSITY OF TOKYO (Japan)

c KYUSHU UNIVERSITY (Japan)

Author keywords

angle resolved photoemission spectroscopy; graphene; Kelvin probe force microscopy; scanning probe microscopy; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINDING ENERGY; BOND STRENGTH (CHEMICAL); CRYSTAL ATOMIC STRUCTURE; ELECTRONIC PROPERTIES; LEAD; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; SUBSTRATES; WORK FUNCTION; X RAY PHOTOELECTRON SPECTROSCOPY;

AMBIENT CONDITIONS; ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; CORE-LEVEL SPECTRA; EPITAXIAL GRAPHENE; INTERCALATED STRUCTURES; KELVIN PROBE FORCE MICROSCOPY; NONCONTACT ATOMIC FORCE MICROSCOPY; STRUCTURAL AND ELECTRONIC PROPERTIES;

GRAPHENE;

EID: 84979992306 PISSN: 16136810 EISSN: 16136829 Source Type: Journal
DOI: 10.1002/smll.201600666 Document Type: Article

Times cited : (55)

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