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Volumn 21, Issue 5, 1988, Pages 543-549

A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. II. Application and discussion of the methodology

Author keywords

[No Author keywords available]

Indexed keywords

FLUORSPAR; FOURIER ANALYSIS; FOURIER TRANSFORMS; POWDERS; X RAY DIFFRACTION; ZIRCONIA;

EID: 84979937162     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889888006624     Document Type: Article
Times cited : (86)

References (17)
  • 15
    • 0003472812 scopus 로고
    • Reading, MA: Addison-Wesley
    • WARREN, B. E. (1969). X-ray Diffraction, p. 272. Reading, MA: Addison-Wesley.
    • (1969) X-ray Diffraction , pp. 272
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.