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Volumn 21, Issue 5, 1988, Pages 543-549
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A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. II. Application and discussion of the methodology
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Author keywords
[No Author keywords available]
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Indexed keywords
FLUORSPAR;
FOURIER ANALYSIS;
FOURIER TRANSFORMS;
POWDERS;
X RAY DIFFRACTION;
ZIRCONIA;
FOURIER METHODS;
INTERCRYSTALLINE;
LATTICE DISORDERS;
LATTICE DISTORTIONS;
MICROSTRUCTURAL FACTORS;
MONOCLINIC POLYMORPHS;
PROFILE FITTING;
ULTRA FINE POWDER;
CRYSTALLITE SIZE;
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EID: 84979937162
PISSN: 00218898
EISSN: 16005767
Source Type: Journal
DOI: 10.1107/S0021889888006624 Document Type: Article |
Times cited : (86)
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References (17)
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