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Volumn , Issue , 2016, Pages
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RF-to-DC and backscatter load modulator characterization
a a a a a |
Author keywords
Backscatter; LabVIEW; Measures; RCS; RF DC; WPT
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Indexed keywords
BACKSCATTERING;
MICROWAVE MEASUREMENT;
MODULATION;
RECONFIGURABLE HARDWARE;
CIRCUIT PARAMETER;
DESIGN COMMUNITY;
IMPROVED DESIGNS;
LABVIEW;
LOAD IMPEDANCE;
LOAD MODULATION;
MEASURES;
RF-DC;
RADIO FREQUENCY IDENTIFICATION (RFID);
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EID: 84979521100
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ARFTG.2016.7501970 Document Type: Conference Paper |
Times cited : (2)
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References (5)
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