Employing time-resolved terahertz spectroscopy to analyze carrier dynamics in thin-film Cu2ZnSn(S,Se)4 absorber layers

Applied Physics Letters

Volumn 104, Issue 25, 2014, Pages

  Guglietta, Glenn W ^a   Choudhury, Kaushik Roy ^b   Caspar, Jonathan V ^b   Baxter, Jason B ^a  

^a Drexel University   (United States)

^b DUPONT COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; RATE CONSTANTS; SEMICONDUCTING SELENIUM COMPOUNDS; TERAHERTZ SPECTROSCOPY;

AUGER RECOMBINATION; CARRIER GENERATION; PHOTOEXCITED CARRIERS; RECOMBINATION MECHANISMS; RECOMBINATION RATE; SHOCKLEY READ HALLS; THIN FILM PHOTOVOLTAICS; TIME-RESOLVED PHOTOLUMINESCENCE;

THIN FILMS;

EID: 84979202556     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4884817     Document Type: Article

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