A New Radio Frequency Plasma Oxygen Primary Ion Source on Nano Secondary Ion Mass Spectrometry for Improved Lateral Resolution and Detection of Electropositive Elements at Single Cell Level

Analytical Chemistry

Volumn 88, Issue 14, 2016, Pages 7130-7136

  Malherbe, Julien ^a   Penen, Florent ^a   Isaure, Marie Pierre ^a   Frank, Julia ^b   Hause, Gerd ^b   Dobritzsch, Dirk ^b   Gontier, Etienne ^c   Horréard, François ^d   Hillion, François ^d   Schaumlöffel, Dirk ^a  

^a UNIVERSITÉ DE PAU ET DES PAYS DE L'ADOUR   (France)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

^c UNIVERSITÉ DE BORDEAUX   (France)

^d CAMECA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CESIUM; CHEMICAL DETECTION; CHEMICAL ELEMENTS; ION BEAMS; ION SOURCES; MASS SPECTROMETRY; OXYGEN; PLANTS (BOTANY); PLASMA THEORY; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; TRACE ELEMENTS; WAVE PLASMA INTERACTIONS;

APPLICATION FIELDS; ARABIDOPSIS THALIANA; BIOLOGICAL SAMPLES; CHLAMYDOMONAS REINHARDTII; DETECTION OF CHEMICALS; ELECTROPOSITIVE ELEMENTS; LONG TERM STABILITY; RADIO FREQUENCY PLASMA;

CESIUM COMPOUNDS;

HEAVY METAL; OXYGEN; TRACE ELEMENT;

ARABIDOPSIS; CHEMISTRY; CHLAMYDOMONAS REINHARDTII; PLASMA GAS; PROCEDURES; RADIOFREQUENCY RADIATION; SECONDARY ION MASS SPECTROMETRY; SINGLE CELL ANALYSIS;

ARABIDOPSIS; CHLAMYDOMONAS REINHARDTII; METALS, HEAVY; OXYGEN; PLASMA GASES; RADIO WAVES; SINGLE-CELL ANALYSIS; SPECTROMETRY, MASS, SECONDARY ION; TRACE ELEMENTS;

EID: 84978870588     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/acs.analchem.6b01153     Document Type: Article

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