Measuring technological novelty with patent-based indicators

Research Policy

Volumn 45, Issue 3, 2016, Pages 707-723

  Verhoeven, Dennis ^a   Bakker, Jurriën ^a   Veugelers, Reinhilde ^a,b,c,d  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b BRUEGEL   (Belgium)

^c CEPR   (United Kingdom)

^d ECOOM ^*  (Belgium)

Author keywords

Novelty; Patent based indicators; Radical inventions

Indexed keywords

CLASSIFICATION (OF INFORMATION);

CITATION INFORMATION; COMPREHENSIVE MEASUREMENT; EX ANTES; NOVELTY; PATENT CLASSIFICATIONS; RADICAL INVENTIONS; TECHNOLOGICAL CHANGE; TWO-DIMENSION;

PATENTS AND INVENTIONS;

EID: 84977535013     PISSN: 00487333     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.respol.2015.11.010     Document Type: Article

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